X-Ray Diffractometry (XRD)

The two-circle system (Fig. 1) is used for powder diffraction. In this system, the samples can be heated in oxidizing, reductive or inert atmosphere up to 1600°C. It is equipped with a Göbel mirror and a position-sensitive detector to save measuring time.

The second system is a high resolution four-circle diffractometer (Fig. 2) that can be used for reciprocal space mappings. It is equipped with a Göbel mirror and an asymmetric two-fold monochromator and allows for the texture analysis of thin film superlattices and single crystalline materials. In both systems, measurements can be carried out fully computer-controlled.