TY - GEN
AU - F. Deppe, S. Saito, H. Tanaka, H. Takayanagi
T1 - Determination of the capacitance of nm scale Josephson junctions
CY - 
PY - 2004
PB - 
T3 - Journal of Applied Physics
VL - 95
UR - http://dx.doi.org/10.1063/1.1645673
SN - 0021-8979